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Is your AFM Tip Tall Enough? - CDI Introduces New AFM Probes |
March 23, 2015
Carbon Design Innovations, Inc.'s introduces new probe technology for high aspect ratio imaging with their new TN series.
1888PressRelease - Every atomic force microscope (AFM) needs high aspect ratio (HAR) capability at least some of the time. The new TN series of HAR probes from Carbon Design Innovations, Inc. (CDI) are for samples 25nm [...]
http://www.1888pressrelease.com/afm/high-aspect-ratio/is-your-afm-tip-tall-enough-cdi-introduces-new-afm-probes-pr-558659.html
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